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Probe Data Recovery Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing

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Description & Details

Summary

  • Probe Data Recovery: Designed for professional data recovery engineers and electronics technicians, this tool helps accurately diagnose and repair storage devices at the hardware level.
  • SD Memory Card & SSD/HDD Support: Suitable for SD memory cards, solid state drives (SSD), and traditional hard disk drives (HDD), allowing you to test, access, and repair multiple types of storage media with a single kit.
  • Flywire / Fly Line Operation: Supports flywire (fly line) connection for direct access to chip pads and test points, ideal for situations where the original circuit path is damaged or needs to be bypassed.
  • PC3000FE Compatibility: Specially designed to cooperate with PC3000FE and similar professional data recovery equipment, ensuring stable signals and accurate test results during chip-level analysis.
  • Chip-Level Test Tool: Enables direct probing of NAND flash chips, controllers, and related components, helping to identify faulty sectors, bad contacts, and timing issues on the board.

Probe Data Recovery Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing Description

Probe Data Recovery: Designed for professional data recovery engineers and electronics technicians, this tool helps accurately diagnose and repair storage devices at the hardware level.
Memory Card & SSD/HDD Support: Suitable for memory cards, solid state drives (SSD), and traditional hard disk drives (HDD), allowing you to test, access, and repair multiple types of storage media with a single kit.
Flywire / Fly Operation: Supports flywire (fly ) connection for direct access to chip pads and test points, ideal for situations where the original circuit path is damaged or needs to be bypassed.
PC3000FE Compatibility: Specially designed to cooperate with PC3000FE and similar professional data recovery equipment, ensuring stable signals and accurate test results during chip-level analysis.
Chip-Level Test Tool: Enables direct probing of NAND flash chips, controllers, and related components, helping to identify faulty sectors, bad contacts, and timing issues the board.

Color: As Shown
Material: Metal

Package Contents:
1*Probe test socket

Details

OPC PWVKFQ9
Codes 6033720995763 (EAN)

Product Images

Probe Data Recovery  Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing 1
Probe Data Recovery  Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing 2
Probe Data Recovery  Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing

Product Data

Height6cm
Width18cm
Length18cm
Weight0.3kg
ColourAs Shown
MaterialMetal

Sorry, this item is temporarily out of stock.

Probe Data Recovery Memory Card PC3000FE Chip Solid State Hard Disk Electronic Test Tool Timing

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