Defect and Microstructure Analysis by Diffraction
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Defect and Microstructure Analysis by Diffraction Description
This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting usto measure the defect solid state: X-ray diffraction.
Details
| OPC | PDHSNZQ |
|---|---|
| Codes | 0198501897 (ISBN-10) |
| 9780198501893 (ISBN) |
Disclaimer: The information below is provided by various external sources and should be used as a guide only.
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the idealized periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative quantitative and structure analysis based on the primary pattern features rapidly matured. In general the deviations of a particular specimen from the ideal or perfect crystal structure cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain crystallite size macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults the strain field produced by each the anisotropic crystallite size and orientation along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Alternative names:
- ISBN Defect and Microstructure Analysis by Diffraction book
Detailed Product Information
Features
| Release date (DD/MM/YYYY) | 06/01/2000 |
|---|---|
| Written by | Robert Snyder, Jaroslav Fiala, Hans J Bunge |
| Publisher | Oxford University Press |
| Suggested gender | Any gender |
| International Standard Book Number (ISBN) | 9780198501893 |
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