Electrical Atomic Force Microscopy for Nanoelectronics Paperback Book
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Sold by: Ria Christie Collections
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Electrical Atomic Force Microscopy for Nanoelectronics Paperback Book Description
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits ICs. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy AFM techniques for their development.
Details
| OPC | PXK9WJ2 |
|---|---|
| Brand | riachristiecollections |
| Codes | 3030156141 (ISBN-10) |
| 9783030156145 (ISBN) | |
| MPN | 9783030156145 |
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