Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Description
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Details
| OPC | PBXM5MM |
|---|---|
| Codes | 9812389407 (ISBN-10) |
| 9789812389404 (ISBN) |
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